The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2020

Filed:

Feb. 13, 2018
Applicant:

Elichens, Grenoble, FR;

Inventor:

Thanh Trung Le, Grenoble, FR;

Assignee:

Elichens, Grenoble, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/27 (2006.01); G01N 21/51 (2006.01); G01N 21/61 (2006.01); G01N 21/33 (2006.01); G01N 21/3504 (2014.01);
U.S. Cl.
CPC ...
G01N 21/274 (2013.01); G01N 21/51 (2013.01); G01N 21/61 (2013.01); G01N 21/33 (2013.01); G01N 21/3504 (2013.01); G01N 2201/06106 (2013.01);
Abstract

A method for analyzing a gaseous sample, by comparing an incident light wave and a transmitted light wave, the method comprising: i) illuminating the sample with a light source emitting the incident light wave propagating up to the sample; ii) detecting a light wave transmitted by the sample; iii) detecting a reference light wave emitted by the light source and representing a light wave reaching a reference photodetector without interacting with the sample; iv) repeating i) to iii) at different measurement instants; v) estimating, at each measurement instant, an intensity of the reference light wave; vi) taking into account the estimated intensity of the reference light wave and the detected intensity of the transmitted light wave to perform a comparison, at each measurement instant; and vii) analyzing the gaseous sample as a function of the comparison.


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