The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2020
Filed:
Nov. 10, 2016
Denso Corporation, Kariya, Aichi-pref., JP;
Norio Gouko, Kariya, JP;
Atusi Sakaida, Kariya, JP;
Toshihisa Taniguchi, Kariya, JP;
Keiji Okamoto, Kariya, JP;
Yoshihiko Shiraishi, Kariya, JP;
DENSO CORPORATION, Kariya, Aichi-pref., JP;
Abstract
An abnormality diagnosis apparatus includes a sensor unit configured to detect a heat flux which flows from a target apparatus toward outside, and a determining unit configured to determine an abnormality of the target apparatus. The sensor unit includes a first heat flux sensor, a second heat flux sensor, and a thermal buffer which is disposed between the first heat flux sensor and the second heat flux sensor and which has predetermined heat capacity. The first heat flux sensor outputs a first sensor signal in accordance with a heat flux which passes through the first heat flux sensor from the target apparatus side toward the thermal buffer side. The second heat flux sensor outputs a second sensor signal in accordance with a heat flux which passes through the second heat flux sensor from the thermal buffer side toward a side farther from the target apparatus. The determining unit determines whether or not there is an abnormality of the target apparatus on the basis of the first sensor signal and the second sensor signal.