The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2020

Filed:

Jul. 18, 2013
Applicant:

Trimble Jena Gmbh, Jena, DE;

Inventors:

Michael Vogel, Schleifreisen, DE;

Thomas Korn, Jena, DE;

Assignee:

TRIMBLE Jena GmbH, Jena, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 15/00 (2006.01); G01C 15/04 (2006.01); G01C 15/06 (2006.01); G01B 21/04 (2006.01); G01B 5/008 (2006.01);
U.S. Cl.
CPC ...
G01C 15/00 (2013.01); G01C 15/04 (2013.01); G01C 15/06 (2013.01); G01B 5/008 (2013.01); G01B 21/04 (2013.01);
Abstract

Assigning measuring points to fixed points includes calculating fixed point distances between fixed points in a fixed point coordinate system; determining coordinates of measuring points in a measuring point coordinate system; calculating measuring point distances between the measuring points; comparing at least two measuring point distances with the fixed point distances and identifying at least two pairs each consisting of a measuring point distance and a fixed point distance; determining a reference point in the measuring point coordinate system or in the fixed point coordinate system; determining first and second reference point parameters of the measuring points or fixed points corresponding to the pairs; determining second reference point parameters of the fixed points corresponding to the pairs in the fixed point coordinate system; identifying correspondences between the first reference point parameters and the second reference point parameters and assigning the corresponding measuring points to the corresponding fixed points.


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