The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2020
Filed:
Aug. 23, 2017
Nec Corporation, Tokyo, JP;
Jun Takada, Tokyo, JP;
NEC CORPORATION, Minato-ku, Tokyo, JP;
Abstract
A defect detecting deviceincludes an overall displacement measurement unitthat measures, based on observation data output from an observation device that observes a target object, a displacement of an overall movement of the target object relative to an observation point at set time intervals, as an overall displacement; a specific period detection unitthat detects a specific period in which the measured overall displacement is in a specific state within a period in which observation is performed; a partial displacement measurement unitthat measures, displacements at a plurality of points set on the target object in the detected specific period, as partial displacements; and a defect detection unitthat detects a defect in the target object, based on the acquired at least one of the temporal changes and the spatial distributions of the partial displacements.