The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2020

Filed:

Jan. 04, 2017
Applicant:

Arkema Inc., King of Prussia, PA (US);

Inventors:

Gunter E. Moeller, Collegeville, PA (US);

Roman Y. Korotkov, King of Prussia, PA (US);

Ryan C. Smith, Schwenksville, PA (US);

Assignee:

Arkema Inc., King of Prussia, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01); G01N 21/84 (2006.01); G01B 11/02 (2006.01); G01B 21/06 (2006.01); G01N 21/25 (2006.01); G01N 21/90 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0633 (2013.01); G01B 11/026 (2013.01); G01B 11/0691 (2013.01); G01B 21/06 (2013.01); G01N 21/255 (2013.01); G01N 21/8422 (2013.01); G01N 21/9054 (2013.01); G01N 2021/8427 (2013.01);
Abstract

Methods and apparatus for measuring a thickness of a coating on an moving object are provided. Light is directed toward the object at a predetermined location on the object such that a portion of the light interacts with the object. A I D and/or 2D maximum intensities for at least one wavelength channel is captured that is produced by the portion of the light interacting with the object. A measured average intensity of the wavelength channel and/or intensities and their arithmetic derivatives of multi wavelength channel geometries is converted into I D (averaged) and/or 2D thickness values. Based on these values an acceptability of the coating is evaluated and thickness calculated.


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