The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2020
Filed:
Dec. 22, 2016
Applicants:
National Institute of Advanced Industrial Science and Technology, Tokyo, JP;
Mitsui Chemicals Tohcello, Inc., Tokyo, JP;
Inventors:
Kinji Asaka, Ikeda, JP;
Tetsuya Horiuchi, Ikeda, JP;
Zicai Zhu, Ikeda, JP;
Mitsuo Takase, Tokyo, JP;
Assignees:
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, Tokyo, JP;
MITSUI CHEMICALS TOHCELLO, INC., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/00 (2006.01); G01B 7/16 (2006.01); G01D 5/14 (2006.01); G01L 1/04 (2006.01); G01L 1/14 (2006.01); G01L 1/16 (2006.01); G01L 1/06 (2006.01); G01L 5/00 (2006.01); G01B 5/30 (2006.01); H01B 1/24 (2006.01); C08K 3/04 (2006.01); B82B 1/00 (2006.01);
U.S. Cl.
CPC ...
G01B 7/16 (2013.01); G01B 5/30 (2013.01); G01D 5/14 (2013.01); G01L 1/04 (2013.01); G01L 1/06 (2013.01); G01L 1/14 (2013.01); G01L 1/16 (2013.01); G01L 5/0057 (2013.01); H01B 1/24 (2013.01); B82B 1/00 (2013.01); C08K 3/041 (2017.05);
Abstract
The invention provides a sensor capable of detecting deformation. The deformation sensor has a structure in which an ion-conductive polymer layer is sandwiched between soft electrodes, wherein non-uniform ion distribution is generated in the ion-conductive polymer layer by deformation, thereby generating a potential difference between the electrodes.