The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2020

Filed:

Apr. 06, 2020
Applicant:

Vaisala Oyj, Vantaa, FI;

Inventors:

Samuli Laukkanen, Helsinki, FI;

Timo Hyvättinen, Helsinki, FI;

Assignee:

Vaisala Oyj, Vantaa, FI;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B60W 40/06 (2012.01); G08G 1/0967 (2006.01);
U.S. Cl.
CPC ...
B60W 40/06 (2013.01); G08G 1/096708 (2013.01); B60W 2552/00 (2020.02); B60W 2555/00 (2020.02);
Abstract

A method and apparatus for calibrating an optical surface condition monitoring system (). Light beams at different wavelengths (λ, λ) are emitted to a reference substrate () at different distances (L, L) as well as to sample substrates () at a specific distance (L). Subsequently, ratios between the signals scattered back from the reference substrate () and the signals scattered back from the sample substrates () are calculated. Then, input data regarding a measurement distance (L) between a target surface () to be monitored, for example a road, and the receiver () of the system () is provided. Further, a preset program is selected. Dry calibration of the system () can then take place based on the calculated ratios, the measurement distance (L) and the selected program. Dry calibration can be calculated without having to perform an actual dry calibration in the field and no dry calibration plate or dry spot of the target surface () is required.


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