The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2020
Filed:
Jun. 07, 2018
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Akira Horiba, Kyoto, JP;
Taro Shirai, Kyoto, JP;
Takahiro Doki, Kyoto, JP;
Satoshi Sano, Kyoto, JP;
Naoki Morimoto, Kyoto, JP;
Assignee:
Shimadzu Corporation, Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto-shi, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01N 23/041 (2018.01); G01N 23/20008 (2018.01); G01N 23/20 (2018.01);
U.S. Cl.
CPC ...
A61B 6/484 (2013.01); A61B 6/4035 (2013.01); A61B 6/4291 (2013.01); A61B 6/54 (2013.01); G01N 23/041 (2018.02); G01N 23/20008 (2013.01); G01N 23/20075 (2013.01);
Abstract
This X-ray phase-contrast imaging apparatus is equipped with a plurality of gratings and grating holders for holding the plurality of gratings. The plurality of gratings is arranged such that the extending direction of grating components of the plurality of gratings is oriented in a direction in which the positional displacement due to the grating holder becomes maximum in a plane orthogonal to an optical axis of the X-ray.