The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2020

Filed:

Apr. 17, 2019
Applicant:

Suntracker Technologies Ltd., Victoria, CA;

Inventors:

Ian Ashdown, West Vancouver, CA;

Wallace Jay Scott, Victoria, CA;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05B 47/105 (2020.01); H05B 47/155 (2020.01); G05B 15/02 (2006.01); G06F 17/11 (2006.01); H05B 45/20 (2020.01); H05B 47/11 (2020.01); H05B 47/16 (2020.01); G06F 30/13 (2020.01); G06F 30/20 (2020.01); G05B 19/042 (2006.01); G05B 19/048 (2006.01); F24F 11/30 (2018.01); F24F 120/10 (2018.01); F24F 130/20 (2018.01); F24F 11/47 (2018.01); G06F 119/06 (2020.01);
U.S. Cl.
CPC ...
H05B 47/105 (2020.01); G05B 15/02 (2013.01); G05B 19/042 (2013.01); G05B 19/048 (2013.01); G06F 17/11 (2013.01); G06F 30/13 (2020.01); G06F 30/20 (2020.01); H05B 45/20 (2020.01); H05B 47/11 (2020.01); H05B 47/16 (2020.01); F24F 11/30 (2018.01); F24F 11/47 (2018.01); F24F 2120/10 (2018.01); F24F 2130/20 (2018.01); F24S 2201/00 (2018.05); G05B 19/0426 (2013.01); G05B 2219/2639 (2013.01); G05B 2219/2642 (2013.01); G06F 2119/06 (2020.01); Y02B 20/42 (2013.01); Y02B 20/46 (2013.01);
Abstract

In an example, an expected sky condition is calculated for a geographic location, a time of day, and a date based on a mathematical model. A predicted distribution of direct and interreflected solar radiation within the environment is calculated based on the expected sky condition. Measurement data from one or more photosensors is obtained that provides measurements of an initial distribution of direct and interreflected radiation within the environment, including radiation from solar and electrical lighting sources. A target distribution of direct and interreflected artificial electromagnetic radiation produced by electrical lighting is determined, based on the measurement data and the predicted distribution of direct and interreflected solar radiation, to achieve the target distribution of direct and interreflected radiation within the environment. Output parameters are set to one or more devices to modify the initial distribution to achieve the target distribution of direct and interreflected radiation within the environment, including diffusion characteristics of the materials between environments.


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