The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2020

Filed:

Dec. 14, 2018
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventor:

Dong Kyoo Kim, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/34 (2006.01); H04L 27/38 (2006.01); H04L 27/227 (2006.01); G01S 13/538 (2006.01); G01S 13/536 (2006.01); H04J 1/06 (2006.01); H04L 27/36 (2006.01);
U.S. Cl.
CPC ...
H04L 27/3427 (2013.01); G01S 13/536 (2013.01); G01S 13/538 (2013.01); H04L 27/2273 (2013.01); H04L 27/389 (2013.01); H04L 27/3863 (2013.01); H04J 1/06 (2013.01); H04L 27/366 (2013.01);
Abstract

A method and an apparatus for measuring a displacement of an object according to steps of: dividing a signal into an I signal and a Q signal according to a phase of the signal, wherein the signal is reflected by the object after a transmission signal having a plurality of frequencies is emitted toward the object by the radar measurement system; estimating a direct current (DC) component from an N-tuple information acquired from the I signal and the Q signal; removing the estimated DC component to correct the I signal and the Q signal; and measuring the displacement of the object based on the corrected I signal and Q signal are provided.


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