The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2020

Filed:

Sep. 04, 2014
Applicant:

Bloom Energy Corporation, Sunnyvale, CA (US);

Inventors:

Emad El Batawi, Sunnyvale, CA (US);

Eric Petersen, San Jose, CA (US);

Mina Touma, Sunnyvale, CA (US);

Richard Stephenson, Sunnyvale, CA (US);

Assignee:

BLOOM ENERGY CORPORATION, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01M 8/2485 (2016.01); H01M 8/1253 (2016.01); H01M 8/0215 (2016.01); H01M 8/0217 (2016.01); H01M 8/0228 (2016.01); H01M 8/0282 (2016.01); H01M 8/2404 (2016.01); H01M 8/2457 (2016.01); H01M 8/2432 (2016.01); H01M 8/2483 (2016.01); H01M 8/2425 (2016.01); H01M 8/124 (2016.01); H01M 2/16 (2006.01); H01M 2/14 (2006.01); H01M 8/04082 (2016.01);
U.S. Cl.
CPC ...
H01M 8/0215 (2013.01); H01M 8/0217 (2013.01); H01M 8/0228 (2013.01); H01M 8/1253 (2013.01); H01M 8/2404 (2016.02); H01M 8/2432 (2016.02); H01M 8/2457 (2016.02); H01M 8/2483 (2016.02); H01M 2/14 (2013.01); H01M 2/16 (2013.01); H01M 8/0282 (2013.01); H01M 8/04201 (2013.01); H01M 8/2425 (2013.01); H01M 8/2485 (2013.01); H01M 2008/1293 (2013.01); H01M 2300/0077 (2013.01);
Abstract

A solid oxide fuel cell (SOFC) stack including a plurality of SOFCs and a plurality of interconnects. Each interconnect is located between two adjacent SOFCs, and each interconnect contains a Mn or Co containing, electrically conductive metal oxide layer on an air side of the interconnect. The SOFC stack also includes a barrier layer located between the electrically conductive metal oxide layer and an adjacent SOFC. The barrier layer is configured to prevent Mn or Co diffusion from the electrically conductive metal oxide layer to the adjacent SOFC.


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