The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2020

Filed:

Dec. 12, 2018
Applicant:

Wuhan Xinxin Semiconductor Manufacturing Co., Ltd., Hubei, CN;

Inventors:

Guangjie Xue, Hubei, CN;

Yun Li, Hubei, CN;

Jun Zhou, Hubei, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 21/28 (2006.01); H01L 21/02 (2006.01); H01L 21/3213 (2006.01); H01L 27/11521 (2017.01);
U.S. Cl.
CPC ...
H01L 29/40114 (2019.08); H01L 21/02071 (2013.01); H01L 21/32139 (2013.01); H01L 27/11521 (2013.01);
Abstract

A method for relieving a hole defect of a gate is disclosed, which includes: providing a substrate; forming a polysilicon layer over the substrate; forming a sacrificial oxide layer over a surface, that faces away from the substrate, of the polysilicon layer; forming a patterned photoresist layer over the sacrificial oxide layer; performing ion implantation by using the patterned photoresist layer as a mask; removing the patterned photoresist layer and the sacrificial oxide layer. In the method, before ion implantation, an oxide layer is formed over the surface of the gate, and is used to reduce affinity of the polysilicon and the photoresist layer. Afterwards, the floating gate is cleaned for many times, and hydrofluoric acid of an appropriate amount is added, so as to completely remove the photoresist layer and other residues while cleaning off the sacrificial oxide layer.


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