The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2020
Filed:
Oct. 29, 2018
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Venkata Chandra Sekar Rao, Bangalore, IN;
Neeraj Kumar Tiwari, Bangalore, IN;
Narayan Kulkarni, Bangalore, IN;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
A method is used in evaluating a test subject in computing environments. A first machine learning system generates test subject features. A second machine learning system analyzes the test subject to detect distinguishing features of the test subject. A third machine learning system performs natural language processing on the test subject features to create evaluation information associated with the test subject. A test subject evaluation system provides an evaluation of the test subject based on the distinguishing features and the evaluation information.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile