The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2020
Filed:
Jan. 31, 2018
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Diego Salomone Bruno, Niterói, BR;
Percy E. Rivera Salas, Rio de Janeiro, BR;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Methods and apparatus are provided for pattern-aware transformation of time series data to multi-dimensional data for Deep Learning analysis. An exemplary method comprises: obtaining time series data and an indication of seasonal components in the time series data; obtaining the time series data separated into data chunks of a predefined length based on at least one seasonal component; aligning the data chunks based on the at least one seasonal component; generating an image and/or a multi-dimensional vector using the aligned data chunks; and applying the image and/or the multi-dimensional vector to a Deep Learning module to obtain a prediction, a classification and/or a profiling of parameters associated with the time series data. The classification of the parameters comprises, for example, an anomaly detection. The profiling of the parameters comprises, for example, a clustering of the parameters and/or a behavior identification.