The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2020

Filed:

Jul. 03, 2019
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Mitsunori Abe, Kawasaki, JP;

Yoshiyuki Hiroshima, Nakano, JP;

Takahiro Kitagawa, Kawasaki, JP;

Akiko Matsui, Meguro, JP;

Naoki Nakamura, Hachioji, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/39 (2020.01); G06F 119/08 (2020.01); G01B 21/32 (2006.01);
U.S. Cl.
CPC ...
G06F 30/39 (2020.01); G01B 21/32 (2013.01); G06F 2119/08 (2020.01);
Abstract

An information processing device includes a processor that calculates a distortion amount that represents an amount of distortion generated in a via of a printed circuit board based on a following equation, Δε={(L×α×Δt×E)/(D×T)}×m×β×γ×η; calculates a lifetime of the via based on a following equation, M=N/(n×365); changes, when the calculated lifetime is outside a first setting range, at least two design values of the via length, the thermal expansion coefficient, the Young's modulus, the via diameter, or the plating thickness within a second setting range corresponding to the at least two design values respectively; gives points of two perspectives affected by the change and outputs a graph that indicates an impact degree according to the points of the two perspectives for each combination of the at least two design values.


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