The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2020

Filed:

Apr. 25, 2017
Applicant:

Analogic Corporation, Peabody, MA (US);

Inventors:

Kevin Brennan, Middleton, MA (US);

William Davidson, North Reading, MA (US);

Patrick Splinter, Middleton, MA (US);

Assignee:

Analogic Corporation, Peabody, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 5/00 (2006.01); G06T 19/00 (2011.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G01V 5/005 (2013.01); G06T 19/00 (2013.01); G06T 11/001 (2013.01); G06T 2219/028 (2013.01);
Abstract

An X-ray inspection system includes at least one display monitor and a console. The console includes at least two different visualization algorithms and a processor. The processor is configured to process volumetric image data with a first of the at least two different visualization algorithms and produce a first processed volumetric image. The processor is further configured to process the volumetric image data with a second of the at least two different visualization algorithms and produce a second processed volumetric image. The processor is further configured to concurrently display the first and second processed volumetric image data via the display monitor. The volumetric image data is indicative of a scanned object and items therein.


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