The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2020
Filed:
Jan. 08, 2018
Oz Optics Ltd., Ottawa, CA;
Safieddin Safavi-Naeini, Waterloo, CA;
Shahed Shahir, Waterloo, CA;
OZ Optics Limited, Ottawa, CA;
Abstract
The present invention presents a flexible, stepped frequency, radar based, imaging inspection system. The imaging inspection system can be used in airports, seaport sites, borders, postal processing centres, and sensitive sites. It comprises a millimetre-wave Stepped Frequency Continuous Wave (SFCW) radar module () connected to a transmitting channel and a receiving channel. The transmitting channel may comprise a frequency upconvertor () and the receiving channel may comprise a frequency downconvertor (). A digital signal processing unit () reconstructs a conductivity profile and a permittivity profile of an object under test (OUT) from measurement data collected via a phase-array antenna or a translational stage () based on synthetic aperture focusing (SAF).