The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2020

Filed:

Dec. 22, 2016
Applicant:

Proplus Design Solutions, Inc., San Jose, CA (US);

Inventor:

Zhihong Liu, Cupertino, CA (US);

Assignee:

Jinan ProPlus Electronics Co., Ltd., Jinan, Shandong Province, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); G01R 31/28 (2006.01); G01R 29/26 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2646 (2013.01); G01R 31/2856 (2013.01); G01R 29/26 (2013.01);
Abstract

Embodiments of apparatuses of a synchronized noise measurement system and methods for using the same are disclosed. In one embodiment, a method of performing noise measurement includes setting up a plurality of device under tests (DUTs), performing noise measurement of the plurality of DUTs synchronously using programmable testing parameters to generate a noise measurement data, collecting the noise measurement data from the plurality of DUTs in parallel, and analyzing the noise measurement data collected to identify deviations in noise performance caused by manufacturing process variations or environmental variations for the plurality of DUTs.


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