The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2020

Filed:

Mar. 22, 2019
Applicant:

Sharp Kabushiki Kaisha, Sakai, Osaka, JP;

Inventors:

Shohei Komaru, Sakai, JP;

Fumiaki Sugimori, Sakai, JP;

Tadashi Iwamatsu, Sakai, JP;

Chika Hirakawa, Sakai, JP;

Mai Takasaki, Sakai, JP;

Assignee:

SHARP KABUSHIKI KAISHA, Sakai, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/70 (2006.01); G01N 27/64 (2006.01); G01N 27/62 (2006.01);
U.S. Cl.
CPC ...
G01N 27/622 (2013.01); G01N 27/64 (2013.01); G01N 27/70 (2013.01);
Abstract

An analysis apparatus includes an ionization section, an ion separation section, and an ion detection section. The ionization section generates one or more sample component-derived ions. The ion separation section separates the ions in accordance with mobility of the ions. The ion detection section detects the ion which passes through the ion separation section. The ionization section includes a reaction chamber and an electron emission element. A sample is introduced to the reaction chamber. The electron emission element emits an electron to the reaction chamber.


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