The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2020

Filed:

Sep. 04, 2018
Applicant:

Aurelius L. Graninger, Sykesville, MD (US);

Inventor:

Aurelius L. Graninger, Sykesville, MD (US);

Assignee:

NORTHROP GRUMMAN SYSTEMS CORPORATION, Falls Church, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 25/12 (2006.01); H01L 27/18 (2006.01); H01L 39/04 (2006.01);
U.S. Cl.
CPC ...
G01N 25/12 (2013.01); H01L 27/18 (2013.01); H01L 39/04 (2013.01);
Abstract

A system for measuring critical temperatures of superconducting components of a superconducting circuit housed in a cryogenic chamber with a controllable ambient temperature is described. The superconducting circuit can have a plurality of superconductor-resistor pairs connected in series. Each of the plurality of superconductor-resistor pairs can include a superconducting component and a resistor coupled in parallel with the superconducting component. The system can also include a resistance meter that measures a resistance of the superconducting circuit. The system further includes a controller that commands the cryogenic chamber to gradually sweep the ambient temperature. The controller can also record an instant ambient temperature as a critical temperature for a given superconducting component of a corresponding one of the plurality of superconductor-resistor pairs in response to detecting a change in a measured resistance across an input node and an output node of the superconducting circuit.


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