The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2020
Filed:
Sep. 12, 2012
Applicant:
Nao Nitta, Tokyo, JP;
Inventor:
Nao Nitta, Tokyo, JP;
Assignee:
Sony Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/50 (2006.01); G01N 15/14 (2006.01); G01J 3/02 (2006.01); G01J 3/28 (2006.01); G01N 21/25 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1429 (2013.01); G01J 3/0264 (2013.01); G01J 3/28 (2013.01); G01J 3/2803 (2013.01); G01N 15/1434 (2013.01); G01N 15/1459 (2013.01); G01N 21/255 (2013.01); G01N 2015/1006 (2013.01);
Abstract
Provided is a spectrum analysis apparatus including a processing unit configured to generate analysis data using an analysis function in which a linear function and a logarithmic function are included as function elements and an intensity value is set as a variable from measurement data including the intensity value of light acquired by detecting the light from a measurement target object using a plurality of light-receiving elements having different detection wavelength bands.