The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2020

Filed:

Oct. 21, 2019
Applicants:

Robert Bosch Gmbh, Stuttgart, DE;

Trumpf Photonic Components Gmbh, Ulm, DE;

Inventors:

Stefan Weiss, Tübingen, DE;

Alexander Herrmann, Reutlingen, DE;

Robert Wolf, Dresden, DE;

Alexander Van Der Lee, Venlo, NL;

Wolfram Johannes Martin Lyda, Mössingen, DE;

Balazs Jatekos, Budapest, HU;

Robert Weiss, Waldbronn, DE;

Sören Sofke, Tübingen, DE;

Hans Spruit, Waalre, NL;

Jens-Alrik Adrian, Pfullingen, DE;

Matthias Falk, Leinfelden-Echterdingen, DE;

Dominik Moser, Neu-Ulm, DE;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 15/06 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 15/06 (2013.01); G01N 15/1429 (2013.01); G01N 2015/0693 (2013.01);
Abstract

A system for determining a particle contamination and a method for determining a particle contamination in a measurement environment is provided in which individual particles in the measurement environment are detected (S), wherein a) an estimate of the number of particles per volume in the measurement environment is ascertained (S), b) an estimate of the number of particles per volume and characterization information describing the particle source in the measurement information are taken as a basis for ascertaining an output value for the particle contamination in the measurement environment (S), and c) context-related data are made available and the characterization information is estimated on the basis of the available context-related data (S). The estimation of the characterization information on the basis of the available context-related data avoids the conventional restriction of the evaluable characterization information to firmly prescribed information and instead provides flexible adaptation of the characterization information to be evaluated to the context-related data.


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