The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2020

Filed:

Jan. 16, 2018
Applicant:

Maxell Joei Tech Co., Ltd., Kanagawa, JP;

Inventor:

Takeshi Shimano, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F21S 41/20 (2018.01); F21S 43/00 (2018.01); F21S 41/00 (2018.01); F21S 45/00 (2018.01); G02B 5/18 (2006.01);
U.S. Cl.
CPC ...
F21S 41/285 (2018.01); F21S 41/00 (2018.01); F21S 43/00 (2018.01); F21S 45/00 (2018.01); G02B 5/18 (2013.01);
Abstract

The diffraction lens has an incident side and an exit side that are both convexly shaped, includes an exit diffraction plane that has an absolute value for the order of diffraction of 5 or greater and is disposed on the exit side, and is shaped such that the absolute value of a curvature at the surface apex of an envelope surface of the exit diffraction plane is smaller than the absolute value of a curvature at the surface apex of an incident surface, or the absolute value of the amount of sag in the direction of the optical axis at an outer periphery of the envelope surface of the exit diffraction plane is smaller than the maximum absolute value of the amount of sag in the direction of the optical axis at an outer periphery of the incident surface.


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