The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2020
Filed:
May. 07, 2018
Geoservices Equipements, Roissy en France, FR;
Matthias Francois, Roissy-en-France, FR;
Josselin Kherroubi, Clamart, FR;
Alexis He, Clamart, FR;
Tetsushi Yamada, Clamart, FR;
Quentin Corlay, Roissy-en-France, FR;
Karim Bondabou, Roissy-en-France, FR;
SCHLUMBERGER TECHNOLOGY CORPORATION, Sugar Land, TX (US);
Abstract
A method for determining a property of a geological formation based on an optical image of rock samples taken from the formation is presented therein. The image comprises a plurality of pixels and the method comprises defining windows in the image, each window comprising predetermined number of pixels and being of a predetermined shape. The method also includes, for each window, extracting a rockprint value representative of the window. A rockprint comprises indicators for characterizing a texture of the window. The method also includes classifying the windows into categories of a predetermined set. Each category is representative of one type of rock and the classification is based on a comparison of the rockprint value of each window with rockprint values of images of reference rock samples for each category. Based on the classification, the method then includes determining the at least one property of the geological formation, ie the quantification of each type of rock in the sample.