The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2020

Filed:

Dec. 05, 2017
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Yoshinori Murakami, Yamanashi, JP;

Toshimichi Aoki, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); G06N 3/00 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
B25J 9/161 (2013.01); B25J 9/163 (2013.01); G06N 3/008 (2013.01); G06N 3/08 (2013.01); G06N 3/084 (2013.01); G05B 2219/45104 (2013.01);
Abstract

A machine learning device for learning operations of a robot and a laser scanner, includes a state observation unit observing a state of a tip end of the robot where the laser scanner is mounted and a state of an optical component in the laser scanner as a state data; a determination data obtaining unit receiving at least one of a machining time of the robot where the laser scanner is mounted, a drive current driving the robot, a command path of the laser scanner, a passing time in a processable area where the laser scanner performs processing, and a distance between the robot and a part where the laser scanner performs processing as a determination data; and a learning unit learning operations of the robot and the laser scanner based on an output of the state observation unit and an output of the determination data obtaining unit.


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