The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2020
Filed:
Mar. 16, 2018
General Electric Company, Schenectady, NY (US);
John Eric Tkaczyk, Delanson, NY (US);
David Allen Langan, Clifton Park, NY (US);
Peter William Lorraine, Niskayuna, NY (US);
Biju Jacob, Niskayuna, NY (US);
Feng Pan, Clifton Park, NY (US);
Hao Lai, Rexford, NY (US);
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Abstract
A method for X-ray imaging includes determining one or more pre-shot parameters corresponding to a region of interest in a subject based on an optical image of the region of interest obtained from an optical sensor. The method further includes controlling an X-ray device to generate a pre-shot X-ray image using a first X-ray dosage, based on the one or more-pre-shot parameters. The method also includes determining at least one main-shot parameter based on the pre-shot X-ray image. The method includes controlling the X-ray device to generate a main-shot X-ray image using a second X-ray dosage greater than the first X-ray dosage, based on the at least one main-shot parameter.