The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2020
Filed:
Oct. 30, 2014
Applicant:
Koninklijke Philips N.v., Eindhoven, NL;
Inventors:
Thomas Koehler, Hamburg, DE;
Bernhard Johannes Brendel, Norderstedt, DE;
Assignee:
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01); G01N 23/046 (2018.01); G01N 23/205 (2018.01);
U.S. Cl.
CPC ...
A61B 6/5258 (2013.01); A61B 6/032 (2013.01); A61B 6/461 (2013.01); A61B 6/467 (2013.01); A61B 6/484 (2013.01); A61B 6/5205 (2013.01); A61B 6/583 (2013.01); G01N 23/046 (2013.01); G01N 23/205 (2013.01);
Abstract
A beam hardening correction method, a related calibration method for tomographic image data and a related apparatus. The tomographic image data includes attenuation data (f) and phase gradient data (g) and/or small angle scattering data (h). A correction value is computed from the attenuation data (f) by applying a function (q) to the attenuation data (f). The correction value is combined (S) with the phase gradient data (g) or with the small angle scattering data (h).