The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2020

Filed:

Dec. 19, 2018
Applicant:

Facebook, Inc., Menlo Park, CA (US);

Inventors:

Ying Li, Menlo Park, CA (US);

Martinus Arnold de Jongh, San Jose, CA (US);

Vincent Gonguet, San Francisco, CA (US);

Assignee:

Facebook, Inc., Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 28/02 (2009.01); H04W 28/24 (2009.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
H04W 28/0226 (2013.01); H04W 28/0268 (2013.01); H04W 28/0289 (2013.01); H04W 28/24 (2013.01); G06N 20/00 (2019.01);
Abstract

In one embodiment, a computing system determines quality of experience metrics and root-cause metrics for geographic areas connected by a communication network based on application data. The system determines that one or more of the geographic areas have low quality of experience based on the quality of experience metrics and a first set of criteria which includes one or more first thresholds for the quality of experience metrics. The system determines causes for the low quality of experience in each associated geographic area having low quality of experience based on the root-cause metrics and a second set of criteria which includes one or more second thresholds and is looser than the first set of criteria. The system determines a solution recommendation for the low quality of experience in each associated geographic area based on the causes of the low quality of experience of that geographic area.


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