The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2020

Filed:

Aug. 08, 2019
Applicant:

Ut-battelle, Llc, Oak Ridge, TN (US);

Inventors:

Sergei V. Kalinin, Oak Ridge, TN (US);

Stephen Jesse, Oak Ridge, TN (US);

Ondrej E. Dyck, Oak Ridge, TN (US);

Bobby G. Sumpter, Oak Ridge, TN (US);

Assignee:

UT-BATTELLE, LLC, Oak Ridge, TN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/16 (2010.01); G01Q 70/12 (2010.01); H01J 37/26 (2006.01); B82B 3/00 (2006.01); H01J 37/317 (2006.01); H01J 37/28 (2006.01); B82Y 15/00 (2011.01); B82Y 40/00 (2011.01);
U.S. Cl.
CPC ...
H01J 37/265 (2013.01); B82B 3/0076 (2013.01); H01J 37/28 (2013.01); H01J 37/317 (2013.01); B82Y 15/00 (2013.01); B82Y 40/00 (2013.01);
Abstract

A system and method (referred to as a method) to fabricate nanorobots. The method generates a pixel map of an atomic object and identifies portions of the atomic object that form a nanorobot. The method stores those identifications in a memory. The method adjusts an electron beam to a noninvasive operating level and images the portions of the atomic object that form the nanorobot. The method executes a plurality of scanning profiles by the electron beam to form the nanorobot and detects nanorobot characteristics and their surroundings via the electron beam in response to executing the plurality of scanning profiles.


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