The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2020

Filed:

Feb. 08, 2019
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Craig L. Chaiken, Pflugerville, TX (US);

Michael W. Arms, Pflugerville, TX (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
G11C 29/50 (2013.01);
Abstract

Embodiments of information handling systems (IHSs) and methods are provided herein to dynamically detect and recover from thermally induced memory failures. Some embodiments include receiving an interrupt corresponding to a memory failure, detecting a current temperature of one or more memory components, and performing a series of memory tests on a specific block of memory within the memory components if the current temperature exceeds a maximum operating temperature specified for the memory components. Some embodiments include storing original contents of the specific block of memory within another memory component of the IHS, performing a first memory test on the specific block of memory at the current temperature, subsequently performing a second memory test on the specific block of memory at a temperature significantly lower than the current temperature, and determining that the memory failure is a thermally induced memory failure if the first memory test fails and the second memory test passes.


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