The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
Feb. 19, 2019
Quality Vision International Inc., Rochester, NY (US);
Eric G. Gesner, Webster, NY (US);
QUALITY VISION INTERNATIONAL INC., Rochester, NY (US);
Abstract
An alignment system for an imaging sensor of a coordinate measuring machine incorporates a reference surface associated with a stage of the measuring machine but instead of imaging the reference surface as a location marker, the reference surface is incorporated into a combined imaging system together with the imaging sensor for imaging a feature associated with the imaging sensor. The imaged feature can be an internal part of the imaging sensor, such as an internal aperture, or an external feature in a fixed relationship with the imaging sensor, such as a lens hood.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile