The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2020

Filed:

Nov. 09, 2018
Applicant:

Olympus Corporation, Hachioji-shi, Tokyo, JP;

Inventor:

Junichi Mori, Hachioji, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/593 (2017.01); G06T 7/13 (2017.01); G06T 7/70 (2017.01); G06T 7/60 (2017.01); G06T 11/20 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06T 7/593 (2017.01); G06T 7/13 (2017.01); G06T 7/60 (2013.01); G06T 7/70 (2017.01); G06T 11/203 (2013.01); G06K 9/6202 (2013.01); G06K 9/6223 (2013.01); G06K 2209/057 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/20101 (2013.01);
Abstract

An image processing apparatus includes at least one circuit. The at least one circuit acquires a plurality of images, including at least a first image and a second image obtained by photographing a subject from different viewpoints, acquires an instruction from a user, sets on the first image a measurement point for which three-dimensional coordinates of the subject are required, based on the instruction, calculates a correspondence point which is on the second image and which corresponds to the measurement point, by matching, calculates a reliability of the matching between the measurement point and the correspondence point as a measurement point reliability, and sets on the first image an alternative measurement point enabling a reliability higher than that of the measurement point reliability, instead of the measurement point, if the measurement point reliability is less than a predetermined threshold value.


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