The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2020

Filed:

Jun. 07, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Benjamin Halberstadt, Jerusalem, IL;

Roger K. Hecker, Efrat, IL;

Ortal Nizri, Jerusalem, IL;

Shlomo Steinhart, Shemesh, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2012.01); G06Q 10/06 (2012.01); G06Q 30/06 (2012.01); G06F 16/25 (2019.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06Q 10/06395 (2013.01); G06F 16/2365 (2019.01); G06F 16/254 (2019.01); G06Q 30/0635 (2013.01);
Abstract

An example system includes a processor that can generate a first lineage graph based on a first set of monitored assets and processes used to produce a data asset. The processor can detect a data quality issue at the data asset. The processor can also generate a second lineage graph including a second set of monitored assets and processes that produced the data asset with the data quality issue. The processor can further compare the second lineage graph with the first lineage graph to detect a potential root cause of the data quality issue. The processor can also further modify an asset or process corresponding to the potential root cause of the data quality issue.


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