The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
Aug. 11, 2016
Yeda Research and Development Co. Ltd., Rehovot, IL;
YEDA RESEARCH AND DEVELOPMENT CO. LTD., Rehovot, IL;
Abstract
A System and a method for processing at least two M-dimensional data-measurements (DMs) of a physical-property for detecting one or more new-objects and/or a transition of one or more known-objects, in complex constant-background DMs, using at least one processor and at least one memory element, the method comprising: generating a filtered-new-DM by match-filtering a new-DM, respective to impulse response of a reference-DM; generating a filtered-reference-DM by match-filtering the reference-DM, respective to impulse response of the new-DM; generating an M-dimensional object-indicator (OI) by subtracting the filtered-reference-DM from the filtered-new-DM, or vice versa; and generating an M-dimensional data score (DS) from the M-dimensional OI, where each of the scores is a probe for existence of an object at a specific M-dimensional location.