The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
Nov. 17, 2017
Vmware, Inc., Palo Alto, CA (US);
Darren Brown, Seattle, WA (US);
Nicholas Kushmerick, Seattle, WA (US);
Mayank Agarwal, Seattle, WA (US);
Junyuan Lin, Seattle, WA (US);
VMware, Inc., Palo Alto, CA (US);
Abstract
The current document is directed to systems, and methods incorporated within the systems, that execute queries against log-file entries. A monitoring subsystem within a distributed computer system uses query results during analysis of log-file entries in order to detect changes in the state of the distributed computer system, identify problems or potential problems, and predict and forecast system characteristics. Because of the large numbers of log-file-entry containers that may need to be opened and processed in order to execute a single query, and because opening and reading through the entries in a log-file-entry container is a computationally expensive and time-consuming operation, the currently disclosed systems employ event-type metadata associated with log-file-entry containers to avoid opening and reading through the log-file entries of log-file-entry containers that do not contain log-file entries with event types relevant to the query.