The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10776249 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 15, 2020

Filed:

Jul. 06, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Ali Y. Duale, Poughkeepsie, NY (US);

Dennis Wittig, Poughkeepsie, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01); G06F 9/30 (2018.01);
U.S. Cl.
CPC ...
G06F 11/3644 (2013.01); G06F 9/30101 (2013.01); G06F 11/3648 (2013.01);
Abstract

A validation and testing method is provided. The validation and testing method is executable by a processor coupled to a memory. The validation and testing method includes inserting intermediary save points within an instruction stream. The method includes executing the instruction stream including the intermediary save points. The method includes executing a save operation for data in one or more registers at each of the one or more intermediary save points.


Find Patent Forward Citations

Duale, Ali. (2020). Flexible and in-line register comparison for bug analysis (U.S. Patent No. 10776249). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10776249

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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