The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2020

Filed:

Nov. 21, 2018
Applicant:

Beihang University, Beijing, CN;

Inventors:

Shunkun Yang, Beijing, CN;

Xiaodong Gou, Beijing, CN;

Tingting Huang, Beijing, CN;

Daqing Li, Beijing, CN;

Chong Bian, Beijing, CN;

Yushu Xie, Beijing, CN;

Wenjing Liu, Beijing, CN;

Qi Yao, Beijing, CN;

Assignee:

BEIHANG UNIVERSITY, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/22 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2257 (2013.01); G06N 7/005 (2013.01);
Abstract

A method for establishing fault diagnosis technique based on contingent Bayesian networks, comprising steps of: step (1) determining a domain of an unknown object to be reasoned; step (2) defining a model structure by adopting a first-order logic language; step (3) generating a Blog model; step (4) transforming the Blog model into the contingent Bayesian networks; step (5) defining the contingent Bayesian networks; step (6) learning parameters of the contingent Bayesian networks; and step (7) reasoning a fault of the contingent Bayesian networks by utilizing a Markov chain Monte Carlo Method. By the steps mentioned above, establishing fault diagnosis technique based on contingent Bayesian networks is achieved.


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