The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2020

Filed:

Jan. 05, 2018
Applicant:

Olympus Corporation, Hachioji-shi, Tokyo, JP;

Inventor:

Hiroshi Ishiwata, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/00 (2006.01); G06T 7/55 (2017.01); G06T 5/40 (2006.01); G06T 5/50 (2006.01); G02B 21/26 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 21/0056 (2013.01); G06T 5/40 (2013.01); G06T 5/50 (2013.01); G06T 7/55 (2017.01); G02B 21/26 (2013.01); G02B 21/361 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10148 (2013.01);
Abstract

A phase distribution calculation method includes: moving a focal position of an optical system to a plurality of positions within a phase object, the plurality of positions being different from each other in an optical axis direction of the optical system, and acquiring an image via the optical system in each of the plurality of positions; calculating a first phase distribution of a three-dimensional region that corresponds to a plurality of images acquired in the plurality of positions, in accordance with the plurality of images; and correcting the first phase distribution in accordance with a change in the optical axis direction in a region of interest specified in the three-dimensional region.


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