The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
Jan. 16, 2018
Fondazione Istituto Italiano Di Tecnologia, Genoa, IT;
FONDAZIONE INSTITUTO ITALIANO DI TECNOLOGIA, Genoa, IT;
Abstract
Microscopy method and apparatus for determining the positions of emitter objects in a three-dimensional space that comprises focusing scattered light or fluorescent light emitted by an emitter object, separating the focused beam in a first and a second optical beam, directing the first and the second optical beam through a varifocal lens having an optical axis such that the first optical beam impinges on the lens along the optical axis and the second beam impinges decentralized with respect to the optical axis of the varifocal lens, simultaneously capturing a first image created by the first optical beam and a second image created by the second optical beam, and determining the relative displacement of the position of the object in the first and in the second image, wherein the relative displacement contains the information of the axial position of the object along a perpendicular direction to the image plane.