The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
May. 09, 2018
Fluke Corporation, Everett, WA (US);
Jeffrey Worones, Seattle, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
Systems and methods for measuring electrical parameters (e.g., voltage, current, power) in an insulated or blank uninsulated conductor (e.g., insulated wire) without requiring a galvanic connection between the conductor and a clamp probe. A clamp probe may include a normally closed, spring loaded jaw having a flexible strap therein that includes one or more non-contact sensors. The jaw may also include a Rogowski coil to enable non-contact current measurements. A user may compress handles of the clamp probe to open its jaw. In the open position, the user may position the jaw around the conductor under test and release the handles. The jaw then closes and tightens the flexible strap around the insulated conductor such that the one or more non-contact sensors are positioned adjacent the insulated conductor to obtain an accurate measurement of an electrical parameter of the insulated conductor.