The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
Jul. 12, 2019
China University of Geosciences (Wuhan), Wuhan, CN;
Fulong Ning, Wuhan, CN;
Li Peng, Wuhan, CN;
Wei Li, Wuhan, CN;
Dongdong Wang, Wuhan, CN;
Wenjia Ou, Wuhan, CN;
Zhichao Liu, Wuhan, CN;
Jiaxin Sun, Wuhan, CN;
Wan Cheng, Wuhan, CN;
Guosheng Jiang, Wuhan, CN;
Ling Zhang, Wuhan, CN;
China University of Geosciences (Wuhan), Wuhan, CN;
Abstract
A testing device for testing adhesion force includes a thermal insulated glove box, an atomic force microscope, a cryogenic sample stage, a high pressure gas source and a circulating chiller. The atomic force microscope includes a probe for adhering mineral particles. The cryogenic sample stage is configured for preparing gas hydrate sample. The cryogenic sample stage is arranged below the probe. The atomic force microscope and the cryogenic sample stage are placed in the thermal insulated glove box. The high pressure gas source provides pressure required for synthesis of gas hydrates, the high pressure gas source comprises a high pressure chamber covered on the cryogenic sample stage and a high pressure gas cylinder connected with the high pressure chamber. The circulating chiller, an outlet of the circulating chiller is connected with the thermal insulated glove box to control humidity and temperature inside the thermal insulated glove box.