The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
Feb. 28, 2018
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Eduarda Mendes Rodrigues, Northwood, GB;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
An automatic defect detection method for detecting a defect in an object comprises: obtaining ultrasound scan data of the object, dividing echo amplitude values of the data into a plurality of sub-sets; assessing each sub-set to determine whether any echo amplitude values resulted from a structure of interest; computing for each sub-set, using at least a representative position of the structure portion of the sub-set and of a neighboring sub-set, a preselected mathematical function which is directly or inversely proportional to a distance between the representative positions; identifying sub-sets having a computed value that does not meet a predetermined criterion as regions of the ultrasound scan data that require inspection; issuing a notification indicating whether or not a region requiring inspection has been found; and if a region requiring inspection been found, storing data identifying the region in a database.