The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2020

Filed:

Oct. 25, 2017
Applicant:

Arkray, Inc., Kyoto, JP;

Inventor:

Masao Kawano, Kyoto, JP;

Assignee:

ARKRAY, Inc., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/447 (2006.01); G01N 33/487 (2006.01); G01N 21/27 (2006.01); G01N 30/86 (2006.01);
U.S. Cl.
CPC ...
G01N 27/44721 (2013.01); G01N 21/27 (2013.01); G01N 27/44769 (2013.01); G01N 27/44791 (2013.01); G01N 30/861 (2013.01); G01N 33/48707 (2013.01); G01N 2030/8648 (2013.01);
Abstract

An analytical method and an analytical system capable of more accurate analysis, in which a sample is analyzed by a capillary electrophoresis technique in which a voltage is applied to a sample solution introduced to a micro flow path, a separation analysis is performed for a component contained in the sample solution, and an optically measured value corresponding to an elapsed time after starting a measurement is measured. The analytical method comprises: a process of determining an interface arrival time point, based on the optically measured value when an interface between the sample solution and a migration liquid reaches a predetermined measurement position in the micro flow path; and a process of identifying the component contained in the sample solution using the optically measured value at the elapsed time after the interface arrival time point.


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