The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
May. 23, 2019
Applicant:
Fanuc Corporation, Yamanashi, JP;
Inventors:
Assignee:
FANUC CORPORATION, Yamanashi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/42 (2006.01); G03B 27/52 (2006.01); G01N 21/958 (2006.01); G03B 11/04 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
G01N 21/958 (2013.01); G03B 11/041 (2013.01); H04N 5/2254 (2013.01); G01N 2021/9583 (2013.01);
Abstract
A system includes a visual sensor provided in an industrial machine or in the vicinity thereof to acquire a plurality of image data, a calculation unit that calculates a contamination degree of a lens or a lens cover of the visual sensor on the basis of the image data acquired by the visual sensor, and a prediction unit that calculates information on a predicted cleaning timing to be performed in the future, of the lens or the lens cover on the basis of the calculated contamination degree of the lens or the lens cover.
Niikura, Miho. (2020). Visual sensor lens or lens cover abnormality detection system (U.S. Patent No. 10775319). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10775319
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile