The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2020

Filed:

Jun. 01, 2017
Applicant:

Xieon Networks S.Ă .r.l., Luxembourg, LU;

Inventor:

Lutz Rapp, Deisenhofen, DE;

Assignee:

XIEON NETWORKS S.a.r.l., Luxembourg, LU;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/94 (2006.01); B01D 46/00 (2006.01); H05K 7/20 (2006.01); G01N 21/956 (2006.01);
U.S. Cl.
CPC ...
G01N 21/94 (2013.01); B01D 46/0086 (2013.01); G01N 21/956 (2013.01); G01N 21/95607 (2013.01); G01N 21/95692 (2013.01); H05K 7/20181 (2013.01); H05K 7/20563 (2013.01); B01D 2273/18 (2013.01); B01D 2273/26 (2013.01);
Abstract

A system () for detecting a level of dirtiness of a filter mat () of an airflow cooling system for telecommunications equipment, the system () comprising a detector () for detecting fluorescent or reflected light backscattered at at least one part in () of the filter mat () comprising or treated with a fluorescent or reflective material, wherein the detector () comprises a light source () for illuminating said at least one part () of the filter mat () with sampling light, and a photosensor () for detecting fluorescent or reflected light backscattered at said at least one part () of the filter mat () caused by the illumination thereof with sampling light, wherein the system () is configured for inferring the level of dirtiness of the filter mat () from the amount of detected fluorescent or reflected light.


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