The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
Jan. 22, 2019
Fujifilm Corporation, Tokyo, JP;
Yoshirou Yamazaki, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are a printed matter inspection device and a printed matter inspection method for appropriately determining visibility of a streaky concentration defect, regardless of the size of a variation of pixel values of an image. A printed matter inspection device determines visibility of a streak from a basic streak intensity that is an intensity of the streak detected from a printed matter, color information and frequency feature information on a streak near-field area that is continuous from an area of the streak and has a variation of image feature amounts that is within a predetermined first range, and frequency feature information on an outer peripheral area that is in contact with the streak near-field area, and determines whether the quality of the printed matter is good or not on the basis of at least the visibility.