The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
Mar. 02, 2018
Ricoh Elemex Corporation, Aichi, JP;
Kochi Prefectural Public University Corporation, Kochi, JP;
RICOH ELEMEX CORPORATION, Aichi, JP;
KOCHI PREFECTURAL PUBLIC UNIVERSITY CORPORATION, Kochi, JP;
Abstract
An inspection system according to one embodiment includes: a first signal output unit that outputs to an illumination unit a first signal serving as a trigger to start outputting stripe patterns; a second signal output unit that outputs to the illumination unit a second signal serving as a trigger to switch the stripe patterns; an image-data acquisition unit that acquires time-correlation image data by starting superimposition of frames output from an image sensor at a timing based on the first signal; an image generation unit that generates a first time-correlation image and a second time-correlation image based on the time-correlation image data, the first time-correlation image corresponding to a first stripe pattern alone, the second time-correlation image corresponding to a second stripe pattern alone; and an abnormality detection unit that detects, based on the first time-correlation image and the second time-correlation image, an abnormality on the inspection target surface.