The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
Dec. 09, 2016
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Yosuke Nakagawa, Tokyo, JP;
Naohiko Ishibashi, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
A plant evaluation apparatus includes: a first computation unit configured to compute a first estimated value of a plant state quantity by using a steady-state model; a first determination unit configured to compute a second estimated value of the plant state quantity by assigning an equipment parameter in a normal state to an equipment parameter of a non-steady-state model; a second computation unit configured to compute a third estimated value of the plant state quantity by using the steady-state model in a case where the first determination unit determines that an error between the second estimated value and an actually measured value is equal to or more than a threshold value; and a second determination unit configured to determine whether or not a difference between the equipment parameter in the normal state and the equipment parameter in an abnormal state is equal to or more than a predetermined value.