The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
Mar. 16, 2018
Broadley-james Corporation, Irvine, CA (US);
Scott T. Broadley, Laguna Beach, CA (US);
Robert J. Garrahy, Laguna Niguel, CA (US);
William E. Reynolds, IV, Irvine, CA (US);
Bradley Joseph Sargent, Mission Viejo, CA (US);
Jared H. Nathanson, Mission Viejo, CA (US);
David J. Sargent, Mission Viejo, CA (US);
Other;
Abstract
Smart measurement probes may provide information regarding calibration data. However, an electronic instrument connected to such a smart measurement probe may be unable to fully utilize the capacities of the smart measurement probe. A measurement probe may be configured to provide information regarding calibration data to an instrument, but may not be able to take into account calibration settings of that instrument if that instrument lacks the capability to communicate that information to the smart measurement probe. To address such issues, an interface device may be connected between the smart measurement probe and the instrument, with the ability to generate simulated sensor outputs. A transmitter interrogation process utilizing these simulated sensor outputs may be used to determine the transmitter settings and provide an emulated sensor output emulating a previous sensor-transmitter pairing.