The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
Dec. 31, 2018
Mapbox, Inc., San Francisco, CA (US);
Daniel Hofmann, Berlin, DE;
Bhargav Kowshik KR, Bangalore, IN;
Mapbox, Inc., San Francisco, CA (US);
Abstract
A feature extraction system extracts map features from an aerial image. The feature extraction system receives an aerial image having pixels and predicts, for each pixel, a probability that the pixel corresponds to a map feature based on a machine learning model. The machine learning model is trained to determine a probability that a pixel corresponds to the map feature based on a training dataset comprising pairs of aerial images and corresponding mask images that describe known instances of the map feature. The feature extraction system identifies a subset of pixels of the plurality of pixels. Each pixel in the subset has a predicted probability that is greater than or equal to a threshold probability that a pixel corresponds to the map feature. The feature extraction system further determines a bounded geometry enclosing the identified subset of pixels, the bounding geometry encompassing an instance of the map feature.